Surface Analytics

Innovative products are increasingly refined by customized surface design, whose processes and surface compositions must be controlled up to the submicroscopic or even atomic level. This is because adhesion, wetting, wear or corrosion are already influenced by the slightest contamination. Therefore, the precise characterization of the chemical, physical and morphological surface properties of materials, workpieces, components and powders is not only essential during product development, but also in process control, quality assurance as well as in damage analysis. Only recent methods of surface analysis provide access to this information.


Electron Spectroscopy for Chemical Analysis (ESCA) with Auger electron spectroscopy and SEM.


High-Resolution Scanning Electron Microscopy (FE-SEM)

with electron- and x-ray-induced EDX analytics


Contact Angle Analysis


Infrared Spectroscopy and Microscopy (FT-IR)

Light Microscopy and Fluorescence Microscopy


Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM)


Raman Spectroscopy and Microscopy




Spectroscopic and Imaging Ellipsometry